Reduced Graphene Oxide (rGO)
Equipment used
- XPS: Thermo Scientific ™ ESCALAB ™ Xi+ X-ray Photoelectron Spectrometer
- RAMAN: BRUKER SENTERRA Il -Confocal Raman Microscope
- BET: Quantachrome Instruments, Autosorb iQ Station 2- automated gas sorption analyzer
- FTIR: Bruker VERTEX 80 Fourier Transform Infrared Spectrometer
Sample Details
- Graphite Source: Kahatagaha Graphite (63 – 125 p)
- Appearance: Soft Black Powder
Analysis and Results
X-ray Photoelectron Spectroscopy (XPS)
The sample was mounted on a glass substrate using double tape. Three different spots per sample were analyzed. Parameters were set as follows, X-Ray source: Monochromatic Al Ka (1486.6 eV), Spot size: 900 um. Survey scans and high resolution scans were collected with pass energies of 150 and 20 eV and with a step size of 1.0 and 0.05 eV. Detailed spectra processing was performed by Thermo Avantage (5.982) software
Results
| Name | Peak BE | Atomic % | Avg. % | ||
| scan 1 | scan 2 | scan 3 | |||
| C1s | 283.19 | 89.16 | 89.82 | 90.62 | 89.87 |
| 015 | 531.82 | 10.84 | 10.18 | 9.38 | 10.13 |
| S2p | 0.00 | 0.00 | 0.00 | 0.00 | |
| CI2p | 0.00 | 0.00 | 0.00 | 0.00 | |
| Fe | 0.00 | 0.00 | 0.00 | 0.00 | |